The OptiLux wavefront sensor is based on the Hartmann-Shack principle and enables the user to extensively characterize practically all industrially-relevant laser types. This comprises partially coherent and wide-band, pulsed and CW light sources.
Optilux is therefore also suitable for measurements on diode lasers and excimer lasers. The energy/power density distribution in the near field, the direction distribution and propagation haracteristics, as well as the complex amplitude of the wave field can be determined from a single measurement. The method works quickly, robustly and without movable optics, which allows a compact sensor design.